Maxbeam2: a new method of identifying salient beamiets [5914-75]

Maxbeam2: a new method of identifying salient beamiets [5914-75]

著者名:

Edwards, J. ( The Univ.. of York (United Kingdom); )
Nicholson, J. ( Qinetiq (United Kingdom); )
O’Keefe, S. ( The Univ.. of York (United Kingdom); )

掲載資料名:

Wavelets XI

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5914

発行年:

2005

開始ページ:

591426

終了ページ:

591426

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459190 [0819459194]

言語:

英語

請求記号:

P63600/5914

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015952
シリーズID:	PA00000029
会議名:	Optics & Photonics : Wavelets
回次:	2005 : 11th
会議開催地:	San Diego, CA, USA
会議開催年:	2005.07.31-2005.08.03

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