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Sampling and uncertainty issues in trending reflectance-based vicarious calibration results [5882-44]

著者名:
Thome, K. ( Optical Sciences Ctr./The Univ. of Arizona (USA) )  
掲載資料名:
Earth observing systems X : 31 July-1 August 2005, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5882
発行年:
2005
開始ページ:
588216
終了ページ:
588216
総ページ数:
1
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458872 [0819458872]
言語:
英語
請求記号:
P63600/5882
資料種別:
国際会議録

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