Optimum instrumentation of a tapping mode, non-optically regulated near-field scanning optical microscope and its applications [5858-33]
- 著者名:
- Lu, N. H. ( De Lin Institute of Technology (Taiwan) and National Taiwan Univ. (Taiwan) )
- Chang, Y. M. ( De Lin Institute of Technology (Taiwan) )
- Tsai, D. P. ( National Taiwan Univ. (Taiwan) )
- 掲載資料名:
- Nano- and Micro-Metrology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5858
- 発行年:
- 2005
- 開始ページ:
- 58580W
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458582 [0819458589]
- 言語:
- 英語
- 請求記号:
- P63600/5858
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
2
国際会議録
Short fiber probs scheme for tapping-mode tuning fork near-field scanning optical microscopy
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |