Nanoscale Deep Level Defect Correlation with Schottky Barriers in 4H-SiC/Metal Diodes

Nanoscale Deep Level Defect Correlation with Schottky Barriers in 4H-SiC/Metal Diodes

著者名:

Tumakha, S.P.

掲載資料名:

Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005

シリーズ名:

Materials science forum

シリーズ巻号:

527-529

発行年:

2006

パート:

2

開始ページ:

907

終了ページ:

910

総ページ数:

4

出版情報:

Stafa-Zuerich: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878494255 [0878494251]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015830
シリーズID:	PA00000012
会議名:	International Conference on Silicon Carbide and Related Materials
回次:	2005
会議開催地:	Pittsburgh, Pennsylvania, USA
会議開催年:	2005.09.18-2005.09.23

類似資料:

1 国際会議録 A Study of Inhomogeneous Schottky Diodcs on n-Type 4H-SiC Ewing, D.J., Wahab, Q., Tumakha, S.P., Brillson, L.J., Ma, X.Y., Sudarshan, T.S., Porter, L.M. Trans Tech Publications	7 国際会議録 Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes Scaltrito, L., Porro, S., Giorgis, F., Mandracci, P., Cocuzza, M., Pirri, C.F., Ricciardi, C., Ferrero, S., Richieri, … Trans Tech Publications
2 国際会議録 Characterization of Ti/Al Ohmic Contacts to p-Type 4H-SiC Using Cathodoluminescence and Auger Electron Spectroscopies Gao, M., Tumakha, S.P., Onishi, T., Tsukimoto, S., Murakami, M., Brillson, L.J. Trans Tech Publications	8 国際会議録 SiC Studied Via LEEN and Cathodoluminescence Spectroscopy Brillson, L.J., Tumakha, S., Okojie, R.S., Zhang, M., Pirouz, P. Trans Tech Publications
3 国際会議録 4H- to 3C-SiC Polytypic Transformation during Oxidation Okojie, R.S., Xhang, M., Pirouz, P., Tumakha, S., Jessen, G., Brillson, L.J. Trans Tech Publications	9 国際会議録 Barrier Inhomogeneities of Mo Schottky Barrier Diodes on 4H-SiC M. Naretto, D. Perrone, S. Ferrero, L. Scaltrito Trans Tech Publications
4 国際会議録 4H- to 3C-SiC Polytypic Transformation during Oxidation Okojie, R.S., Xhang, M., Pirouz, P., Tumakha, S., Jessen, G., Brillson, L.J. Trans Tech Publications	10 国際会議録 Inverted Pyramid Defects in 4H-SiC Epilayers A. Shrivastava, P.G. Muzykov, T.S. Sudarshan Trans Tech Publications
5 国際会議録 Surface Morphology and Chemistry of 4H- and 6H-SiC after Cyclic Oxidation Okojie, R.S., Lukco, D., Keys, L., Tumakha, S., Brillson, L.J. Trans Tech Publications	11 国際会議録 Correlation between Leakage Current and Ion-Irradiation Induced Defects in 4H-SiC Schottky Diodes Raineri, V., Roccaforte, F., Libertino, S., Ruggiero, A., Massimino, V., Calcagno, L. Trans Tech Publications
6 国際会議録 Surface Morphology and Chemistry of 4H- and 6H-SiC after Cyclic Oxidation Okojie, R.S., Lukco, D., Keys, L., Tumakha, S., Brillson, L.J. Trans Tech Publications	12 国際会議録 Comparison of Current - Voltage Characteristics of n - and p-Type 6H-SiC Schottky Diodes Zhang, Q., Madangarli, V., Gao, Y., Sudarshan, T.S. Materials Research Society

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