Oxford HEXameter: Laboratory High Energy X-Ray Diffractometer for Bulk Residual Stress Analysis

Oxford HEXameter: Laboratory High Energy X-Ray Diffractometer for Bulk Residual Stress Analysis

著者名:

掲載資料名:

Residual stresses VII : ECRS 7 : proceedings of the 7th European conference on residual stresses, Berlin, Germany, 13-15 September 2006

シリーズ名:

Materials science forum

シリーズ巻号:

524-525

発行年:

2006

開始ページ:

743

終了ページ:

748

総ページ数:

6

出版情報:

Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878494149 [0878494146]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015828
シリーズID:	PA00000012
会議名:	European Conference on Residual Stresses
回次:	7th
会議開催地:	Berlin, Germany
会議開催年:	2006.09.13-2006.09.15

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