Blank Cover Image

Development of Finite Element Analysis Scheme for Micro Forming Using Grain Element and Grain Boundary Element

著者名:
掲載資料名:
Progress on advanced manufacture for micro/nano technology 2005 : proceedings of the 2005 International Conference on Advanced Manufacture Taipei, Taiwan, R.O.C. November 28th-December 2nd, 2005
シリーズ名:
Materials science forum
シリーズ巻号:
505-507
発行年:
2006
パート:
1
開始ページ:
61
終了ページ:
66
総ページ数:
6
出版情報:
Uetikon-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499908 [0878499903]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

Kang, C. G., Youn, S. W., Lee, J. W.

Trans Tech Publications

C.Y. Tang, C.P. Tsui, D.Z. Chen, P.S. Uskokovic, J.P. Fan, X.L. Xie, E.W.M. Lee

Trans Tech Publications

Kang, T.W., Leem, J.H., Hou, Y.B., Ryu, Y.S., Lee, H.Y., Jeon, H.C., Hyun, J.K., Kang, C.K., Kim, T.W.

SPIE

Y.S. Ha, S.H. Cho, T.W. Jang

Trans Tech Publications

J. Lee, D.-S. Hong, W.-B. Na, J.-T. Kim

Society of Photo-optical Instrumentation Engineers

Y.S. Kim, J.E. Lee, S.H. Kang, T.W. Kim

Trans Tech Publications

Lee, E.-H., Lee, S.G., Park, B.H.O.S.G., Kim, K.H., Kang, J.K., Chin, I., Kwon, Y.K., Choi, Y.W.

SPIE - The International Society of Optical Engineering

Lee, E.-H., Lee, S.G., Kim, B.H.O.K.H., Kang, J.K., Kwon, Y.K., Chin, I.-J., Cho, Y.W., Song, S.H.

SPIE - The International Society of Optical Engineering

Lee, E.-H., Lee, S.G., Park, B.H.O.S.-G., Kim, K.H., Kang, J.K., Choi, Y.W.

SPIE - The International Society of Optical Engineering

Kang,T.W., Leem,J.H., Hou,Y.B., Jeon,H.C., Hyun,J.K., Lee,H.Y., Han,M.S., Hahn,S.R.

SPIE-The International Society for Optical Engineering

Lee, H.W., Lee, G.A., Yoon, D.J., Choi, S., Lee, N.K., Lee, H.J., Bae, S.M.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12