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The Role of Metal and Passivation Defects in Electromigration-Induced Damage in Thin Film Conductors

著者名:
掲載資料名:
Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
10
発行年:
1982
開始ページ:
397
終了ページ:
408
総ページ数:
12
出版情報:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444007742 [0444007741]
言語:
英語
請求記号:
M23500/10
資料種別:
国際会議録

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