Structures and Properties of an Ultra-Low-k Material: Classical-Molecular-Dynamics and First-Principles Calculations
- 著者名:
Ushio, Jiro Hamada, Tomoyuki Ohno, Takahisa Nakao, Shin-Ichi Yoneda, Katsumi Kato, Manabu Kobayashi, Nobuyashi - 掲載資料名:
- Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 914
- 発行年:
- 2006
- 開始ページ:
- 21
- 終了ページ:
- 26
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558998705 [1558998705]
- 言語:
- 英語
- 請求記号:
- M23500/914
- 資料種別:
- 国際会議録
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