Evaluation on Defects of Er and Yb Implanted Al0.70Ga0.30As by Using Positron Annihilation Spectroscopy
- 著者名:
- 掲載資料名:
- Progress in semiconductor materials V--novel materials and electronic and optoelectronic applications : symposium held November 28-December 1, 2005, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 891
- 発行年:
- 2006
- 開始ページ:
- 179
- 終了ページ:
- 184
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558998452 [1558998454]
- 言語:
- 英語
- 請求記号:
- M23500/891
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
The Er3+ and Yb3+-related emission from Er,Yb co-implanted Al0.70Ga0.30As/GaAs prepared MOCVD method
Materials Research Society |
Trans Tech Publications |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
4
国際会議録
Phase Separation of La0.70-xErxSr0.30MnO3 and its Effect on Magnetic and Magnetocaloric Properties
Trans Tech Publications |
Materials Research Society |
Trans Tech Publications |
Society of Photo-optical Instrumentation Engineers |
6
国際会議録
Superparamagnetism and Giant Magnetoresistance in Partially Milled and Annealed Fe0.30Cr0.70
Trans Tech Publications |
Materials Research Society |