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QUALITY OF BULK CdTe SUBSTRATES AND ITS RELATION TO INTRINSIC DEFECTS

著者名:
Meyer, B.K.
Hofmann, D.M.
Stadler, W.
Emanuelsson, P.
Omling, P.
Weigel, E.
Muller-Vogt, G.
Wienecke, F.
Schenk, M.
さらに 4 件
掲載資料名:
Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
299
発行年:
1994
開始ページ:
185
終了ページ:
190
総ページ数:
6
出版情報:
Pittsburgh, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558991958 [1558991956]
言語:
英語
請求記号:
M23500/299
資料種別:
国際会議録

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