RELAXATION OF ELECTRON BEAM-INDUCED METASTABLE DEFECTS IN a-Si:H

RELAXATION OF ELECTRON BEAM-INDUCED METASTABLE DEFECTS IN a-Si:H

著者名:

掲載資料名:

Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

297

発行年:

1993

開始ページ:

655

終了ページ:

660

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991934 [155899193X]

言語:

英語

請求記号:

M23500/297

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015781
シリーズID:	PA00000011
会議名:	Symposium on amorphous silicon technology
回次:	1993
会議開催地:	San Francisco, CA, USA
会議開催年:	1993.04.13-1993.04.16

類似資料:

1 国際会議録 COMPARISON OF ELECTRON BEAM-INDUCED AND LIGHT- INDUCED DEFECT SATURATION IN a-Si:H Grimbergen, M., Lopez-Otero, A., Fahrenbruch, A., Benatar, L., Redfield, D., Bube, R., McConville, R. Materials Research Society	7 国際会議録 METASTABLE DEFECTS AND STRETCHED EXPONENTIALS Redfield, David, Bube, Richard MRS - Materials Research Society
2 国際会議録 COUPLED EFFECTS OF LIGHT AND TEMPERATURE ON DEGRADATION OF a-Si:H Benatar, L.E., Grimbergen, M., Redfield, D., Bube, R.H. Materials Research Society	8 国際会議録 "STABLE" DEFECTS AS METASTABLE DEFECTS IN A-Si:H Redfield, D. Materials Research Society
3 国際会議録 SATURATION OF METASTABLE-DEFECT DENSITY IN a-Si:H Redfield, D., Bube, r. H. Materials Research Society	9 国際会議録 LINKAGE OF EFFICIENCY AND STABILITY OF a-Si SOLAR CELLS Redfield, D., Bube, R. H. Materials Research Society
4 国際会議録 COMPREHENSIVE KINETICS OF DEFECTS IN a-Si:H Redfield, D., Bube, R.H. Materials Research Society	10 国際会議録 INTERPRETATION OF STRETCHED-EXPONENTIAL DEFECT KINETICS IN a-Si:H Redfield, D. Materials Research Society
5 国際会議録 ISOLATION OF TEMPERATURE EFFECTS ON THE KINETICS OF LIGHT INDUCED DEFECT GENERATION IN a-Si:H Benatar, L., Grimbergen, M., Fahrenbruch, A., Lopez-Otero, A., Redfield, D., Bube, R. Materials Research Society	11 国際会議録 Alternative Mechanism for Defect Generation in a-Si:H Redfield, D. MRS - Materials Research Society
6 国際会議録 THERMAL AND OPTICAL STRETCHED EXPONENTIALS IN DEFECT KINETICS IN a-Si:H Redfield, D., Bube, R. Materials Research Society	12 国際会議録 Imaging of defects in cadmium telluride using high resolution transmission electron microscopy Ponce, F.A., Yamashita, T., Bube, R.H., Sinclair, R. North Holland

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