EFFECTS OF ELECTRODE SPACING AND HYDROGEN DILUTION ON a-SiC:H AND a-Si:H LAYERS
- 著者名:
Daey Ouwens, J. Schropp, R.E.I. van der Werf, C.H.M. von der Linden, M.B. Maree, C.H.M. van der Weg, W.F. Rava, P. Demichelis, F. Pirri, C.F. Tresso, E. - 掲載資料名:
- Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 297
- 発行年:
- 1993
- 開始ページ:
- 61
- 終了ページ:
- 66
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991934 [155899193X]
- 言語:
- 英語
- 請求記号:
- M23500/297
- 資料種別:
- 国際会議録
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