IMAGING OF METAL/SEMICONDUCTOR INTERFACE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY (BEEM)
- 著者名:
- 掲載資料名:
- Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 295
- 発行年:
- 1993
- 開始ページ:
- 231
- 終了ページ:
- 234
- 総ページ数:
- 4
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991903 [1558991905]
- 言語:
- 英語
- 請求記号:
- M23500/295
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
Materials Research Society |
MRS - Materials Research Society | |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
4
国際会議録
OPTICAL PROPERTIES AND INTERNAL PHOTOEMISSION IN EPITAXIAL COMPOSITES OF CoSi2 PARTICLES IN SILICON
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
SPIE - The International Society of Optical Engineering |