IN-SITU LASER PROCESSING AND MICROSTRUCTURAL CHARACTERISTICS OF YBa2Cu307-δ THIN FILMS ON Si WITH TiN BUFFER LAYER

IN-SITU LASER PROCESSING AND MICROSTRUCTURAL CHARACTERISTICS OF YBa2Cu307-δ THIN FILMS ON Si WITH TiN BUFFER LAYER

著者名:

掲載資料名:

Laser ablation in materials processing : fundamentals and applications : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

285

発行年:

1993

開始ページ:

311

終了ページ:

318

総ページ数:

8

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991804 [1558991808]

言語:

英語

請求記号:

M23500/285

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015769
シリーズID:	PA00000011
会議名:	Symposium on laser ablation in materials processing
回次:	1992
会議開催地:	Boston, MA, USA
会議開催年:	1992.12.01-1992.12.04

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