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CHARACTERIZATION OF THE ZnSe/GaAs INTERFACE LAYER BY TEM AND SPECTROSCOPIC ELLIPSOMETRY

著者名:
Dahmani, R.
Salamanca-Riba, L.
Beesabathina, D.P.
Nguyen, N.V.
Chandler-Horowitz, D.
Jonker, B.T.
さらに 1 件
掲載資料名:
Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
280
発行年:
1993
開始ページ:
271
終了ページ:
274
総ページ数:
4
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991750 [1558991751]
言語:
英語
請求記号:
M23500/280
資料種別:
国際会議録

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