RECOMBINATION LIFETIMES IN a-Si:H/a-Si:H MULTILAYERS

RECOMBINATION LIFETIMES IN a-Si:H/a-Si:H MULTILAYERS

著者名:

掲載資料名:

Amorphous silicon technology, 1992

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

258

発行年:

1992

開始ページ:

565

終了ページ:

570

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991538 [1558991530]

言語:

英語

請求記号:

M23500/258

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015742
シリーズID:	PA00000011
会議名:	Amorphous Silicon Technology : Symposium
回次:	1992
会議開催地:	San Francisco, CA, USA
会議開催年:	1992.04.27-1992.05.01

類似資料:

1 国際会議録 NON-EQUILIBRIUM CARRIER DYNAMICS IN a-Si:H/a-SiC:H MULTILAYERS Petrauskas, M., Kolenda, J., Galeckas, A., Schwarz, R., Wang, F., Muschik, T., Fischer, T., Weinert, H. Materials Research Society	7 国際会議録 RADIATIVE RECOMBINATION IN a-Si:H-FETs Carius, R. Materials Research Society
2 国際会議録 ANOMALOUS CARBON INTERDIFFUSION IN a-Si:H/a-SiC:H MULTILAYERS Schwarz, R., Fischer, T., Hanesch, P., Lanz, J., Schirmacher, W., Kolodzey, J., Zorn, G., Goebel, H. Materials Research Society	8 国際会議録 Interpretation of Carrier Recombination Lifetime and Diffusion Length Measurements in Silicon Bullis, W.M., Huff, H.R. Electrochemical Society
3 国際会議録 LUMINESCENCE PROPERTIES OF SILICON OXYNITRIDE FILMS Fischer, T., Muschik, T., Schwarz, R., Kovalev, D., Koch, F. MRS - Materials Research Society	9 国際会議録 Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement Ling,C.H., Teoh,H.K., Choi,W.K., Zhou,T.Q., Ah,L.K. Trans Tech Publications
4 国際会議録 The Tail States as Sensitizing Recombination Centers for Holes Lifetime in a-Si:H Lubianiker, Y., Rapaport, R., Balberg, I., Fonseca, L., Weisz, S. Z. MRS - Materials Research Society	10 国際会議録 EFFECTS OF SURFACE IRON ON RECOMBINATION LIFETIME AND ITS REMOVAL FROM SILICON SURFACES Park, H., Helms, C.R., Tran, M., Triplett, B.B. Electrochemical Society
5 国際会議録 Hydrogen loss and interdiffusion in amorphous Si/SiC multilayers Zorn,G., Kolodzey,J., Gobel,H., Fischer,T., Hanesch,P., Schwarz,R. Trans Tech Publications	11 国際会議録 MOBILITY-LIFETIME PRODUCTS IN a-Si:H AND THE DANGLING BOND RECOMBINATION MODEL Morgado, E. Materials Research Society
6 国際会議録 DETERMINATION OF DRIFT, EXTENDED STATE MOBILITY AND RECOMBINATION LIFETIME IN COMPENSATED a-Si:H BY PHOTOMIXING Tang, Y., Braunstein, R., von Roedern, B., Shapiro, F.R. Materials Research Society	12 国際会議録 Anomalous interface degradation of a-Si:H TFTs during LCD lifetime Libsch,F.R., Tsujimura,T. SPIE-The International Society for Optical Engineering

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