LOW-TEMPERATURE DEVICE-QUALITY SiO2/Si (100) INTERFACES PREPARED BY A COMBINED REMOTE PLASMA OXIDATION-DEPOSITION PROCESS
- 著者名:
- 掲載資料名:
- Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 238
- 発行年:
- 1992
- 開始ページ:
- 713
- 終了ページ:
- 720
- 総ページ数:
- 8
- 出版情報:
- Pittsburgh: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991323 [1558991328]
- 言語:
- 英語
- 請求記号:
- M23500/238
- 資料種別:
- 国際会議録
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