SYNCHROTRON X-RAY TOPOGRAPHIC STUDY OF THE BEHAVIOR OF DEFECTS IN HIGH CARBON-CONTENT Si WAFERS DURING RTP
- 著者名:
- 掲載資料名:
- Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 225
- 発行年:
- 1991
- 開始ページ:
- 301
- 終了ページ:
- 306
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991194 [1558991190]
- 言語:
- 英語
- 請求記号:
- M23500/225
- 資料種別:
- 国際会議録
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