ORIENTATION DEPENDENCE OF THE STABILITY OF STRAINED Sn EPILAYERS GROWN ON Cd0.8Zn0.2Te SUBSTRATES
- 著者名:
- 掲載資料名:
- Long-wavelength semiconductor devices, materials, and processes : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 216
- 発行年:
- 1991
- 開始ページ:
- 439
- 終了ページ:
- 444
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991088 [1558991085]
- 言語:
- 英語
- 請求記号:
- M23500/216
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
Trans Tech Publications | |
Electrochemical Society |
11
国際会議録
Comparative study of bulk Hg0.8Cd0.2Te crystals grown from initial components of varying purity
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |