Blank Cover Image

CHARACTERIZATION OF GaAs/Si INTERFACE STRUCTURE BY X-RAY DIFFRACTION

著者名:
Specht, E.D.
Ice, G.E.
Peters, C.J.
Sparks, C.J.
Lucas, N.
Zhu, X.-M.
Moret, R.
Morkoc, H.
さらに 3 件
掲載資料名:
Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
208
発行年:
1991
開始ページ:
321
終了ページ:
326
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991002 [155899100X]
言語:
英語
請求記号:
M23500/208
資料種別:
国際会議録

類似資料:

Bommannavar, Arun S., Sparks, C. J., Habenschuss, A., Ice, G. E., Dhere, A., Morkoc, H., Zabel, H.

Materials Research Society

Sparks, C.L., Specht, E.D., Zschack, P., Schneibel, J.

Materials Research Society

Kumar, P., Sparks, C.L., Shiraishi, T., Specht, E.D., Zschack, P., Ice, G.E., hisatsune, K.

Materials Research Society

Otsuka, N., Choi, C., Nakamura, Y, Nagakura, S., Fischer, R., Peng, C.K., Morkoc, H.

Materials Research Society

Kiely, C.J., Rockett, A., Chyi, J-I., Morkoc, H.

Materials Research Society

E. Miura, G.E. Ice, E.D. Specht, J.W.L. Pang, H. Kato, K. Hisatsune, I. Inoue

Trans Tech Publications

Gubicza, J., Dragomir, I.C., Ribarik, G., Zhu, Y.T., Valiev, R., Ungar, T.

Trans Tech Publications

Sparks, C.J., Hasaka, M., Easton, D.S., Baik, S., Habenschuss, T., Ice, G.E.

Materials Research Society

Kiely, C.J., Chyi, J-I., Rokett, Chyi A,, Morkoc, H.

Materials Research Society

Ice, G.E., Specht, E.D., Tischler, J.Z., Khounsary, A.M., Assoufid, L., Liu, C.

SPIE - The International Society of Optical Engineering

Herman, M.H., Ward, I.D., Kopf, R.F., Pearton, S.J., Jones, E.D.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12