Blank Cover Image

IN SITU DIAGNOSTICS OF EPITAXIAL GROWTH USING REFLECTANCE-DIFFERENCE

著者名:
掲載資料名:
Chemical perspectives of microelectronic materials II : symposium held November 26-28, 1990, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
204
発行年:
1991
開始ページ:
47
終了ページ:
52
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990968 [1558990968]
言語:
英語
請求記号:
M23500/204
資料種別:
国際会議録

類似資料:

1 国際会議録 46a. Growth of Semiconductor Nanowires from Organometallic Sources Using Cbe and Movpe

Lars Samuelson

American Institute of Chemical Engineers
7 国際会議録 Predicting Growth Rates of SiC Epitaxial Layers Grown by Hot-Wall Chemical Vapor Deposition

Danielsson, O., Jonsson, S., Henry, A., Janzen, E.

Trans Tech Publications
2 国際会議録 CBE GROWTH CHARACTERIZATION OF GaAs AND InGaAs BY RHEED AND RD

Paulsson, G., Junno, B., Samuelson, L.

Materials Research Society
8 国際会議録 Investigation of GaN Epilayers Growth Mechanisms Using In Situ Reflectance in MOCVD

Moret, Matthieu, Briot, Olivier, Ruffenach-Clur, Sandra, Aulombard, Roger-Louis

Materials Research Society
3 国際会議録 Aerotaxy: A New Route to Formation of GaAs Nanocrystals from Ga Droplets

Samuelson, Lars, Deppert, Knut, Malm, Jan-Olle

MRS - Materials Research Society
9 国際会議録 LUMINESCENCE SPECTROSCOPY ON INDIVIDUAL NANOSTRUCTURES AND IMPURITY ATOMS USING STM AND SEM

Samuelson, Lars, Gustafsson, Anders, Hessman, Dan, Lindahl, Joakim, Montelius, Lars, Petersson, Anders, Pistol, …

MRS - Materials Research Society
4 国際会議録 In- Situ Characterization of Epitaxial Semiconductor Growth by Reflectance Anisotropy Spectroscopy

Bhattacharya, A., Haberland, K., Poser, F., Zettler, J.T., Zorn, M., Weyers, M., Richter, W.

SPIE-The International Society for Optical Engineering
10 国際会議録 Significance of wood products in forest sector carbon balances

Nabuurs Gert-Jan

Springer
5 国際会議録 REFLECTANCE-DIFFERENCE SPECTROSCOPY: A NEW REAL-TIME. IN-SITU ANALYSIS OF MBE AND OMCVD GROWTH SURFACES

Colas, E., Aspnes, D. E., Bhat, R., Studna, A. A., Koza, M. A., Keramidas, V. G.

Materials Research Society
11 国際会議録 Single-Photon Ionization, In Situ Optical Diagnostic of Molecular Beam Epitaxial Growth of GaAs

Ott, Adina K., Casey, Sean M., Alstrin, April L., Leone, Stephen R.

MRS - Materials Research Society
6 国際会議録 Vertically-Stacked InAs Islands Between GaAs Barriers Grown by Chemical Beam Epitaxy

Miller, Mark, Jeppesen, Soren, Georgsson, Kristina, Kowalski, Bernhard, Malm, Jan-Olle, Pistol, Mats-Erik, Samuelson, …

MRS - Materials Research Society
12 国際会議録 IN-SITU dry etching of InP using phosphorus tri-chloride and re-growth inside a chemical beam epitaxial growth chamber

Kapre, R. M., Tsang, W. T., Sciortino, P. F., Jr.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12