*A DAMAGE INTEGRAL APPROACH TO SOLDER JOINT FATIGUE
- 著者名:
- 掲載資料名:
- Electronic packaging materials science V : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 203
- 発行年:
- 1991
- 開始ページ:
- 395
- 終了ページ:
- 404
- 総ページ数:
- 10
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990951 [155899095X]
- 言語:
- 英語
- 請求記号:
- M23500/203
- 資料種別:
- 国際会議録
類似資料:
The American Society of Mechanical Engineers |
Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
3
国際会議録
The Reliability Assessment of Flip Chip Type Solder Joints Based on the Damage Integral Approach
MRS - Materials Research Society |
The American Society of Mechanical Engineers |
Materials Research Society |
Materials Research Society |
Materials Research Society |
The American Society of Mechanical Engineers |
Materials Research Society |
Materials Research Society |