Blank Cover Image

THE GROWTH AND CHARACTERISATION OF Ir SILICIDE FILMS ON (111)Si

著者名:
掲載資料名:
Evolution of thin-film and surface microstructure : symposium held November 26-December 1, 1990, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
202
発行年:
1991
開始ページ:
25
終了ページ:
30
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990944 [1558990941]
言語:
英語
請求記号:
M23500/202
資料種別:
国際会議録

類似資料:

1 国際会議録 MeV ION BEAM APPLICATIONS IN III-V SEMICONDUCTORS

Elliman, R.G., Ridgway, M.C., Johnson, S.T., Williams, J.S.

Materials Research Society
7 国際会議録 Structural and Electronic Properties of the 6H-SiC(0001)/Al2O3 Interface Prepared by Atomic Layer Deposition

Seyller, Th., Gao, K., Ley, L., Ciobanu, F., Pensl, G., Tadich, A., Riley, J.D., Leckey, R.C.G.

Trans Tech Publications
2 国際会議録 ION-BEAM INDUCED EPITAXIAL CRYSTALLIZATION OF GeXSi1-X/Si HETEROSTRUCTURES

Elliman, R.G., Ridgway, M.C., Williams, J.S.

Materials Research Society
8 国際会議録 Electronjc and Atomic Structure of the C-Termiuated 6H-SiC Surface

Hollering,M., Mattem,B., Maier,F., Ley,L., Stampfl,A.P.J., Xue,J., Riley,J.D., Leckey,R.C.G.

Trans Tech Publications
3 国際会議録 ION-BEAM INDUCED EPITAXIAL CRYSTALLIZATION OF NiSi2 AND CoSi2

Ridgway, M.C., Elliman, R.G., Williams, J.S.

Materials Research Society
9 国際会議録 Initial Stages of the Graphite-SiC(0001) Interface Formation Studied by Photoelectron Spectroscopy

K.V. Emtsev, T. Seyller, F. Speck, L. Ley, P. Stojanov, J.D. Riley, R.C.G. Leckey

Trans Tech Publications
4 国際会議録 A High-Resolution Photoemission Study of Hydrogen-Terminated 6H-SiC Surfaces

Sieber, N., Seyller, T., Ley, L., Polcik, M., James, D., Riley, J.D., Leckey, R.C.G.

Trans Tech Publications
10 国際会議録 CoSi2 FORMATION ON STRAINED GexSi1-x LAYERS BY Co/GexSi1-x THERMAL REACTION

Ridgway, M. C., Elliman, R. G., Pascual, R., Whitton, J. L., Baribeau, J. -M.

MRS - Materials Research Society
5 国際会議録 A High-Resolution Photoemission Study of Hydrogen-Terminated 6H-SiC Surfaces

Sieber, N., Seyller, Th., Ley, L., Polcik, M., James, D., Riley, J.D., Leckey, R.C.G.

Trans Tech Publications
11 国際会議録 Co/SiXGe1-X ALLOY FORMATION ON STRAINED SiXGe1-X LAYERS

Ridgway, M C., Elliman, R. G., Hauser, N., Baribeau, J.-M., Jackman, T. E.

Materials Research Society
6 国際会議録 The Atomic Structure of the Hydrogen Saturated a-Planes of 4H-SiC

Seyller, Th., Sieber, N., Emtsev, K.V., Graupner, R., Ley, L., Tadich, A., James, D., Riley, J.D., Leckey, R.C.G., …

Trans Tech Publications
12 国際会議録 Epitaxy of Thin Ternary Co1-xFexSi2 Silicide Films on Si(111)

Khouchaf, L., Berling, D., Pierron-Bohnes, V., Pirri, C., Hong, S., Wetzel, P., Gewinner, G., Tuilier, M. H., Lefebvre, …

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12