RESIDUAL STRESS ANALYSIS OF A MULTI-LAYER THIN FILM STRUCTURE BY DESTRUCTIVE (CURVATURE) AND NON-DESTRUCTIVE (X-RAY) METHODS
- 著者名:
- 掲載資料名:
- Interfaces between polymers, metals, and ceramics : symposium held April 25-27, 1989, San Diego, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 153
- 発行年:
- 1989
- 開始ページ:
- 363
- 終了ページ:
- 368
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990265 [1558990267]
- 言語:
- 英語
- 請求記号:
- M23500/153
- 資料種別:
- 国際会議録
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