INVESTIGATIONS OF CuInSe2 THIN FILMS AND CONTACT
- 著者名:
Raud, S. Vu, Quat T. Nicolet, M. -A. Pollock, G. A. Mitchell, K. W. Leavitt, K. W. Ashbaugh, M. D. McIntyre, L. C. - 掲載資料名:
- Thin film structures and phase stability : symposium held April 16-17, 1990, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 187
- 発行年:
- 1990
- 開始ページ:
- 101
- 終了ページ:
- 106
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990760 [1558990763]
- 言語:
- 英語
- 請求記号:
- M23500/187
- 資料種別:
- 国際会議録
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4
国際会議録
ON THE CRITIAL LAYER THICKNESS OF STRAINED-LAYER HETERO-EPITAXIAL CoSi2 FILMS ONF < 111 > Si
Materials Research Society |
SPIE - The International Society for Optical Engineering |
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