Blank Cover Image

*EVALUATION IN SITU OF THE STATE OF DETERIORATION OF MONUMENTAL STONES BY NON-DESTRUCTIVE ULTRASONIC TECHNIQUES

著者名:
掲載資料名:
Materials issues in art and archaeology II : symposium held April 17-21, 1990, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
185
発行年:
1991
開始ページ:
273
終了ページ:
284
総ページ数:
12
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990746 [1558990747]
言語:
英語
請求記号:
M23500/185
資料種別:
国際会議録

類似資料:

1 国際会議録 *MECHANICAL STRESSES GENERATED BY CRYSTALLIZATION OF SALTS INSIDE TREATED AND NON-TREATED MONUMENTAL STONES; MONITORING AND INTERPRETATION BY ACOUSTIC EMISSION/ …

Esbert, R.. M., Montoto, M., Suarez del Rio, L. M., Ruiz de Argandona, V. G., Grossi, C. M.

Materials Research Society
7 国際会議録 Non-destructive Evaluation of Ceramics

Wevers M.

Kluwer Academic Publishers
2 国際会議録 Non-Destructive Evaluation of CMP Pads Using Scanning Ultrasonic Technique

Diaz, A.Belyaev; F., Moreno, W., Ostapenko, S., Pacheno, F., Tarasov, I., Totzke, D.

Electrochemical Society
8 国際会議録 In-situ turbulence measurement technique using state-of-the-art kite/blimp platforms

Balsley,B.B., Jensen,M.L., Frehlich,R.C., Eaton,F.D., Bishop,K.P., Hugo,R.J.

SPIE - The International Society for Optical Engineering
3 国際会議録 Non-Destructive Evaluation of Interfaces in BSOI Structures using the Picosecond Ultrasonics Technique

Sadana, D.K., Hao, H.-Y., Maris, H.J.

Electrochemical Society
9 国際会議録 Ultrasonic Non-Destructive Evaluation of Adhesive Thin Layer

Wan Jae Lee, Wei Yang, Wenji Victor Chang

American Institute of Chemical Engineers
4 国際会議録 Case study of non-linear inverse problems: mammography and non-destructive evaluation

Kosheleva, O., Cabrera, S., Osegueda, R., Ferregut, C., Nazarian, S., George, D.L., George, M.J., Kreinovich, V., …

SPIE
10 国際会議録 CHARACTERIZATION OF THE DFZ IN SILICON WAFERS BY A NON-DESTRUCTIVE TECHNIQUE

Borrego, J.M., Gutmann, R.J., Jensen, N., Lo, C.S.

Materials Research Society
5 国際会議録 Non-Destructive Technique for Evaluation of Degradation on Solar Cells

M. Halama, J. Tkáč, O. Monbaliu, Y. Zhu

Trans Tech Publications
11 国際会議録 Non-Destructive SiC Wafer Evaluation Based on an Optical Stress Technique

Ma, X., Parker, M., Ma, Y., Kubota, T., Sudarshan, T.S.

Trans Tech Publications
6 国際会議録 Non-Destructive Tests as Durability Indicators in Cement Mortars with Pozzolanic Substitutions

R. Ruiz Ruiz, E.M. Alonso Guzmán, W. Martínez Molina, H.L. Chávez García, J.A. Velázquez Perez

Trans Tech Publications
12 国際会議録 In-Line and Non-Destructive Analysis of Epitaxial Si1-x-yGe xCy by Spectroscopic Ellipsometry and Comparison with Other Established Techniques

Loo, R., Meunier-Beillard, P., Delhougne, R., Koumoto, T., Geenen, L., Brijs, B., Vandervorst, W.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12