Blank Cover Image

*HREM VISUALIZATION OF LIGHT ATOMS: AN APPLICATION TO THE STUDY OF CARBON DEFECTS IN ORDERED TRANSITION METAL CARBIDES

著者名:
Epicier, T.  
掲載資料名:
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
183
発行年:
1990
開始ページ:
255
終了ページ:
266
総ページ数:
12
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990722 [1558990720]
言語:
英語
請求記号:
M23500/183
資料種別:
国際会議録

類似資料:

Landesman, J. P., Turchi, P., Ducastelle, F., Treglia, G.

North-Holland

Epicier. T

Kluwer Academic Publishers

Ohnishi,N., Onozuka,T., Hirabayashi,M.

Trans Tech Publications

Cerezo, A., Hetherington, M. G., Petford-Long, A. J. K.

Materials Research Society

Terasaki, O., Ohsuna, T., Alfredsson, V., Bovin, J.-O., Carr, S. W., Anderson, M. W., Watanabe, D.

Elsevier

Maria Milina, Sean T. Hunt, Christopher H. Hendon, Yuriy Román-Leshkov

American Institute of Chemical Engineers

Sinclair,R., Konno,T.J., Ko,D.Hong

Trans Tech Publications

De Novion. H. C, Beuneu. B, Priem. T, Lorenzelli. N, Finel. A

Kluwer Academic Publishers

Oyama, S. T., Silva, V. T. da, Ramanathan, S., Kapoor, R.

American Institute of Chemical Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12