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RELIABILITY OF OHMIC CONTACTS FOR AlGaAs/GaAs HBTs

著者名:
Jackson, G. S.
Tong, E.
Saledas, P.
Kazior, T. E.
Sprague, R.
Brooks, R. C.
Hsieh, K. C.
さらに 2 件
掲載資料名:
Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
181
発行年:
1990
開始ページ:
289
終了ページ:
294
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990708 [1558990704]
言語:
英語
請求記号:
M23500/181
資料種別:
国際会議録

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