Blank Cover Image

PRECIPITATION OF COPPER AND COBALT AT GRAIN BOUNDARIES IN SILICON

著者名:
掲載資料名:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
163
発行年:
1990
開始ページ:
579
終了ページ:
584
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990517 [1558990518]
言語:
英語
請求記号:
M23500/163
資料種別:
国際会議録

類似資料:

Moller, H.J., Jendrich, U., Huang, L., Foitzik, A.

Materials Research Society

STUTZLER,F.J., TAPFER,L., QUEISSER,H.J.

Trans Tech Publications

Tutken, T., Schroter, W., Moller, H.J.

Materials Research Society

Elkajbaji,M., Thibault,J.

Trans Tech Publications

Moller, H. J., Chung, Juyong, Huang, Lan

Materials Research Society

Moller, H.J.

Materials Research Society

Griess, M., Seibt, M., Moller, H.J.

Materials Research Society

Werner, J., Jantsch, W., Froehner, K.H., Queisser, H.J.

North-Holland

H. Miura, T. Sakai, R. Mogawa, J.J. Jonas

Trans Tech Publications

Abdelaoui,R., Nouet,G., Allais,G.

Trans Tech Publications

W. Feng, J.H. Zhang, S. Yang

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12