Blank Cover Image

OPTICAL ABSORPTION OF DEEP DEFECTS IN NEUTRON IRRADIATED SEMI-INSULATING GaAs

著者名:
掲載資料名:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
163
発行年:
1990
開始ページ:
175
終了ページ:
178
総ページ数:
4
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990517 [1558990518]
言語:
英語
請求記号:
M23500/163
資料種別:
国際会議録

類似資料:

Jones,B.K., Santana,J.M., Sloan,T.

Trans Tech Publications

Shah, M., Manasreh, M. O., Kaspi, R., Yen, M. Y., Philips, B. A., Skowronski, M., Shinar, J.

MRS - Materials Research Society

Fillard, J.P., Castagne, M., Bonnafe, J., Gall, P.

Materials Research Society

Saarinen,K., Kuisma,S., Makine,J., Hautojarvi,P., Tornqvist,M., Corbel,C.

Trans Tech Publications

Kaminski,P., Pawlowski,M., Kozlowski,R., Cwirko,R., Palczewska,M.

SPIE-The International Society for Optical Engineering

Kozlowski,R., Kaminski,P., Kordos,P., Pawlowski,M., Cwirko,R.

SPIE-The International Society for Optical Engineering

Castaldini, A., Cavallini, A., Polenta, L., Canali, C., Nava, F., Puente, E. de la, Alvarez, A., Jimenez, J.

MRS - Materials Research Society

Koztowski,R., Pawiowski,M., Kaminski,P., Cwirko,J.

SPIE - The International Society for Optical Engineering

Hoschl,P., Grill,R., Franc,J., Belas,E., Turjanska,L., Turkevych,I., Benz,K.W., Fiederle,M.

SPIE-The International Society for Optical Engineering

Kazukauskas, V., Kuprusevicius, E., Vaitkus, J.-V., Smith, K.M.

Trans Tech Publications

Venger, Y.F., Semenova, G.N., Braylovsky, Y.Yu., Strzelecka, S., Korsunskaya, N.Ye., Strupinski, W., Sadofyev, Y.G., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12