THE ELECTRONIC STRUCTURE OF THE "0.15 Ev" Cu ACCEPTOR LEVEL IN GaAs
- 著者名:
- 掲載資料名:
- Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 163
- 発行年:
- 1990
- 開始ページ:
- 169
- 終了ページ:
- 174
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990517 [1558990518]
- 言語:
- 英語
- 請求記号:
- M23500/163
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
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MRS - Materials Research Society |
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3
国際会議録
Confinement Effects on the Electronic Structure of Shallow Acceptors in GaAs/AlGaAs Quantum Wells
Trans Tech Publications |
MRS - Materials Research Society |
MRS - Materials Research Society |
Trans Tech Publications |
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
MRS - Materials Research Society |