Blank Cover Image

REDUCTION OF THERMAL STRESS IN MEB GROWN GaAs/Si BY PATTERING

著者名:
掲載資料名:
III-V heterostructures for electronic/photonic devices : symposium held April 24-27, 1989, San Diego, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
145
発行年:
1989
開始ページ:
317
終了ページ:
324
総ページ数:
8
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990180 [1558990186]
言語:
英語
請求記号:
M23500/145
資料種別:
国際会議録

類似資料:

1 国際会議録 *GaAs ON Si GROWN BY MBE: PROGRESS AND APPLICATIONS FOR SELECTIVITY DOPED HETEROJUNCTION TRANSISTORS (SDHTs)

Chand, Naresh, Ziel, van der J. O., Weiner, J. S., Sergent, a. M., Lang, d. V.

Materials Research Society
7 国際会議録 Optical Properties of Strain-Induced Nanometer Scale

Gershoni D., Weiner J. J., Fitzgerald A. E., Pfeiffer N. P., Chand N.

Kluwer Academic Publishers
2 国際会議録 HIGH 2DEG MOBILITY AND FABRICATION OF HIGH PERFORMANCE A1GaAs/GaAs SELECTIVELY DOPED HETEROSTRUCTURE TRANSISTORS AND RING OSCILLATORS ON Si SUBSTRATES

Chand, Naresh, Ren, F., Van der Ziel, J. P., Chen, Y. K.

Materials Research Society
8 国際会議録 Measurement of Residual Stress in Thermally Grown Oxide Layers in Thermal Barrier Coating Systems - Development of Non-DestructiveTest Methods

Saunders, S.R.J., Banks, J.P., Chen, G., Chunnilall, C.J.

Trans Tech Publications
3 国際会議録 (InAs)1/(GaAs)n SUPERLATTICE QUANTUM WELL LASERS

Lopata, J., Dutta, N.K., Chand, Naresh

Materials Research Society
9 国際会議録 OBSERVATION OF THE WURTZITE PHASE IN OMVPE GROWN 2nSe/GaAs: EFFECT ON IMPLANTATION AND RAPID THERMAL ANNEALING

Jones, K. S., Yu, J., Lowen, P. D., Kisker, D.

Materials Research Society
4 国際会議録 Optimization of stress in LPCVD polysilicon films for MEMS applications

Singh,J., Chand,A., Chandra,S.

SPIE-The International Society for Optical Engineering
10 国際会議録 STRESS FREE GaAs GROWN ON Si(100)

Freundlich, A., Grenet, J. C., Strobl, G., Neu, G., Teissere, M.

Materials Research Society
5 国際会議録 TUNABILITY OF INTRINSIC STRESS IN SiOx DIELECTRIC FILMS FORMED BY MOLECULAR BEAM DEPOSITION

Chand, Naresh, Kola, R. R., Osenbach, J. W., Tsang, W. T.

MRS - Materials Research Society
11 国際会議録 ELECTICAL CHARACTERIZATION OF DEFECTS IN GaAs GROWN ON Si BY MBE

Chand, N., Fischer, R., Sergent, A. M., Lang, D. V., Cho, A. Y.

Materials Research Society
6 国際会議録 ANALYSIS AND COMPARISON OF ELF2 CONCENTRATION AND STRESS DISTRIBUTION IN UNDOPED LEC-GROWN SEMI-INSULATING GaAs INGOTS

Dobrilla, P., Blakemore, J.S.

Materials Research Society
12 国際会議録 ANNEALING OF GROWN-IN DEFECTS IN GaAs

Dannefaer, S., Mascher, P., Kerr, D.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12