HIGH QUALITY n-Cd0.2Hg0.8Te GROWN BY LIQUID PHASE EPITAXY
- 著者名:
- 掲載資料名:
- Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 102
- 発行年:
- 1988
- 開始ページ:
- 91
- 終了ページ:
- 96
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837708 [0931837707]
- 言語:
- 英語
- 請求記号:
- M23500/102
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |
MRS - Materials Research Society |
3
国際会議録
Comparative study of bulk Hg0.8Cd0.2Te crystals grown from initial components of varying purity
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
国際会議録
ORIENTATION DEPENDENCE OF THE STABILITY OF STRAINED Sn EPILAYERS GROWN ON Cd0.8Zn0.2Te SUBSTRATES
Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
Electrochemical Society |
Trans Tech Publications |
12
国際会議録
Characterization of (La0.9Sr0.1)1+X(Ga0.8Mg0.2)O3-d Electrolytes with Nonstoichiometric Compositions
Electrochemical Society |