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INVESTIGATIONS OF MICROSTRUCTURAL CHANGES IN NICKEL THIN FILMS ON ION-IMPLANTED SILICON BY CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY WITH INTERMITTENT ANNEALINGS IN N2 AMBIENT

著者名:
掲載資料名:
Initial stages of epitaxial growth : symposium held April 22-24, 1987, Anaheim, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
94
発行年:
1987
開始ページ:
293
終了ページ:
298
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837616 [0931837618]
言語:
英語
請求記号:
M23500/94
資料種別:
国際会議録

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