Blank Cover Image

IMPROVING SIGNAL-TO-NOISE LIMITS IN HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY

著者名:
掲載資料名:
Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
82
発行年:
1987
開始ページ:
109
終了ページ:
114
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837470 [0931837472]
言語:
英語
請求記号:
M23500/82
資料種別:
国際会議録

類似資料:

1 国際会議録 SURFACE STUDIES OF SILICON WITH A HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE

Gibson, J.M., McDonald, M.L., Unterwald, F.C., Gossmann, H.-J., Bean, J.C., Tung, R.T.

Materials Research Society
7 国際会議録 Transmission electron microscopy and diffraction from semiconductor interfaces and surfaces

Gibson M. J.

Plenum Press
2 国際会議録 Quantitative High-Resolution Transmission Electron Microscopy - The Role of Space Charge in Blurring Images

Schwartz, A. M., Gibson, J. M., Zheng, T.

MRS - Materials Research Society
8 国際会議録 Strain in coherent Ge quantum islands on Si measured by transmission electron microscopy

Liu, C-P., Miller, P. D., Henstrom, W. L., Gibson, J. M.

MRS-Materials Research Society
3 国際会議録 *STRUCTURAL STUDIES OF METAL-SEMICONDUCTOR INTERFACES WITH HIGH-RESOLUTION ELECTRON MICROSCOPY

Gibson, J. M., Tung, R. T., Poate, J. M.

North-Holland
9 国際会議録 *IN-SITU TRANSMISSION ELECTRON MICROSCOPY OF THE ETCHING OF SILICON (111) SURFACES BY OXYGEN

Gibson, J. M., Ross, F. M.

Materials Research Society
4 国際会議録 The Surface Kinetics of the Initial Oxidation Stages of Copper as Investigated by In Situ Ultra-High Vacuum Transmission Electron Microscopy

Yang, J.C., Bhardwaj, M.D., Tropia, L., Gibson, J.M.

Trans Tech Publications
10 国際会議録 High Resolution Transmission Electron Microscopy of a β'-Sialon-TiN Nanocomposite

Wang,C.M., Riley,F.L., Stalios,A.D.

Trans Tech Publications
5 国際会議録 HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY V

Mazur, J. H., Grodzinaki, P., Nouhi, A., Stirn, R. J.

Materials Research Society
11 国際会議録 In situ High-Resolution Transmission Electron Microscopy of Interfaces in Phase Transformations

Howe,J.M., Moore,K.T., Csontos,A.A., Benson,W.E., Tsai,M.M.

Trans Tech Publications
6 国際会議録 IN-SITU TRANSMISSION ELECTRON MICROSCOPY STUDIES OF THE OXIDATION OF Si(111) 7x7

Gibson, J.M.

Materials Research Society
12 国際会議録 Metal-ZnO Interfaces Studied by High-Resolution Transmission Electron Microscopy

Hosson, J. Th. M. De, Vellinga, W. P., Groen, H. B., Kooi, B. J.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12