COMPOSITIONAL STUDIES OF SEMICONDUCTOR ALLOYS BY BRIGHT FIELDS ELECTRON MICROSCOPE IMAGING OF WEDGED CRYSTALS
- 著者名:
- 掲載資料名:
- Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 77
- 発行年:
- 1987
- 開始ページ:
- 473
- 終了ページ:
- 478
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837562 [0931837561]
- 言語:
- 英語
- 請求記号:
- M23500/77
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
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6
国際会議録
A Correlation between Compositional Fluctuations and Surface Undulations in Strained Layer Epitaxy
Trans Tech Publications |
SPIE - The International Society for Optical Engineering |