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DEFECT CREATION AND PHOTOABLATION IN STOICHIOMETRIC AND SUB-STOICHIOMETRIC SiO2

著者名:
掲載資料名:
Defect properties and processing of high-technology nonmetallic materials : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
60
発行年:
1986
開始ページ:
303
終了ページ:
312
総ページ数:
10
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837258 [0931837251]
言語:
英語
請求記号:
M23500/60
資料種別:
国際会議録

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