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EXPERIMENTAL AND THEORETICAL ANALYSIS OF THE ABOVE THRESHOLD CHARACTERISTICS OF AMORPHOUS SILICON ALLOY FIELD EFFECT TRANSISTORS

著者名:
Hack, M.
Shur, M.
Hyun, C.
Yaniv, Z.
Cannella, V.
Yang, M.
さらに 1 件
掲載資料名:
Materials issues in applications of amorphous silicon technology : symposium held April 15-17, 1985, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
49
発行年:
1985
開始ページ:
373
終了ページ:
378
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837142 [0931837146]
言語:
英語
請求記号:
M23500/49
資料種別:
国際会議録

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