Blank Cover Image

HIGH RESOLUTION Z-CONTRAST IMAGING AND LATTICE LOCATION ANALYSIS OF DOPANTS IN ION-IMPLANTED SILICON

著者名:
掲載資料名:
Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
41
発行年:
1985
開始ページ:
287
終了ページ:
294
総ページ数:
8
出版情報:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9780931837067 [0931837065]
言語:
英語
請求記号:
M23500/41
資料種別:
国際会議録

類似資料:

Pennycook, S. J., Narayan, J., Culbertson, R. J.

Materials Research Society

El-Ghor, M.K., Pennycook, S.J., Sjoreen, T.P., Narayan, J.

Materials Research Society

Pennycook, S. J., Narayan, J., Holland, O. W.

North-Holland

Appleton, B. R.., Narayan, J., Holland,. O, W.,, Pennycook, S. J.

North-Holland

Culbertson, R.J., Pennycook, S.J.

Materials Research Society

Jesson, D.E., Pennycook, S.J., Chisholm, M.F.

Materials Research Society

Pennycook, S. J., Culbertson, R. J., Berger, S. D.

Materials Research Society

Pennycook, S. J.

Materials Research Society

Culbertson, R.J., Pennycook, S.J.

Materials Research Society

Pennycook, S. J., Jesson, D. E., McgGibbon, A. J.

MRS - Materials Research Society

Pennycook, S.J., Culbertson, R.J.

Materials Research Society

Winter,S., Biasser,S., Hofsass,H., Jahn,S., Lindner,G., Recknagel,E.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12