HIGH RESOLUTION Z-CONTRAST IMAGING AND LATTICE LOCATION ANALYSIS OF DOPANTS IN ION-IMPLANTED SILICON
- 著者名:
- 掲載資料名:
- Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 41
- 発行年:
- 1985
- 開始ページ:
- 287
- 終了ページ:
- 294
- 総ページ数:
- 8
- 出版情報:
- Pittsburgh: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837067 [0931837065]
- 言語:
- 英語
- 請求記号:
- M23500/41
- 資料種別:
- 国際会議録
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