THE THICKNESS EFFECT ON THE MICROSTRUCTURE OF SPUTTERED FILMS STUDIED BY A NEW X-RAY DIFFRACTION METHOD
- 著者名:
- Hecq, M.
- 掲載資料名:
- Applied materials characterization : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 48
- 発行年:
- 1985
- 開始ページ:
- 55
- 終了ページ:
- 62
- 総ページ数:
- 8
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837135 [0931837138]
- 言語:
- 英語
- 請求記号:
- M23500/48
- 資料種別:
- 国際会議録
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