ELECTRON TRAPPING/DETRAPPING IN THIN SiO2 UNDER HIGH FIELDS

ELECTRON TRAPPING/DETRAPPING IN THIN SiO2 UNDER HIGH FIELDS

著者名:

掲載資料名:

Thin films : the relationship of structure to properties : symposium held April 15-17, 1985, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

47

発行年:

1985

開始ページ:

99

終了ページ:

106

総ページ数:

8

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837128 [093183712X]

言語:

英語

請求記号:

M23500/47

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015530
シリーズID:	PA00000011
会議名:	Symposium on thin films
回次:	1985
会議開催地:	San Francisco, CA, USA
会議開催年:	1985.04.15-1985.04.17

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