Blank Cover Image

PHOTOLUMINESCENCE AND RAMAN SPECTROSCOPY OF CUBIC SiC GROWN BY CHEMICAL VAPOR DEPOSITION ON Si SUBSTRATES

著者名:
Freitas Jr., J. A.
Bishop, S. G.
Addamiano, A.
Klein, P. H.
Kim, H. J.
Davis, R. F.
さらに 1 件
掲載資料名:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
46
発行年:
1985
開始ページ:
581
終了ページ:
586
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837111 [0931837111]
言語:
英語
請求記号:
M23500/46
資料種別:
国際会議録

類似資料:

Freitas, Jr., J.A., Bishop, S.G.

Materials Research Society

Freitas,J.A.,Jr., Saparin,G.V., Nam,O-H., Zheleva,T.S., Davis,R.F.

SPIE - The International Society for Optical Engineering

Kim. S., Li, X., Coleman, J. J., Zhang, R., Hansen, D. M., Kuech, T. F., Bishop, S. G.

MRS - Materials Research Society

Chung, H.J., Huh, S.W., Polyakov, A.Y., Nigam, S., Li, Q., Grim, J., Skowronski, M., Glaser, E.R., Carlos, W.E., …

Trans Tech Publications

Carlos, W. E., Moore, W. J., Siebenman, P..G., Freitas Jr., J. A., Kaplan, R., Bishop, S. G., Nordquist Jr., P. E. R., …

Materials Research Society

Z. S. Lee, Z. C. Feng, A. G. Li, H. L. Tsai, J. R. Yang, Y. F. Chen, N. Li, I. T. Ferguson, W. Lu

SPIE - The International Society of Optical Engineering

Freitas, Jr., J.A., Butler, J.E., Bishop, S.G., Carrington, W.A., Strom, U.

Materials Research Society

Kong, H.S., Glass, J.T., Davis, R.F., Nutt, S.R.

Materials Research Society

B. Krishnan, S.P. Kotamraju, S.G. Sundaresan, Y. Koshka

Trans Tech Publications

Okamoto, M., Kosugi, R., Nakashima, S., Fukuda, K., Arai, K.

Trans Tech Publications

Liu, H.X., Ali, G.N., Palle, K.C., Mikhov, M.K., Skromme, B.J., Reitmeyer, Z.J., Davis, R.F.

Materials Research Society

Linthicum, K. J., Gehrke, T., Thomson, D., Ronning, C., Carlson, E. P., Zorman, C. A., Mehregany, M., Davis, R. F.

MRS-Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12