PHOTO-EPR AND SPATIALLY RESOLVED EPR OF AsGa IN As-GROWN GaAs

PHOTO-EPR AND SPATIALLY RESOLVED EPR OF AsGa IN As-GROWN GaAs

著者名:

掲載資料名:

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

46

発行年:

1985

開始ページ:

201

終了ページ:

206

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837111 [0931837111]

言語:

英語

請求記号:

M23500/46

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015529
シリーズID:	PA00000011
会議名:	Symposium on microscopic identification of electronic defects in semiconductors
回次:	1985
会議開催地:	San Francisco, CA, USA
会議開催年:	1985.04.15-1985.04.18

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2 国際会議録 Determination of the FR3 Acceptor Level by Direct Excitation of the FR3 EPR in Undoped Semiinsulating GaAs Baeumler,M., Mooney,P.M., Kaufmann,U. Trans Tech Publications	8 国際会議録 DEFECTS IN PHOTO-ASSISTED CBE-GROWN GaAs Goodhew, Peter J., Beanland, R., Farrell, T. Materials Research Society
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