CHARACTERIZATION, CONTROL, AND REDUCTION OF SUBBOUNDARIES IN SILICON ON INSULATORS
- 著者名:
- 掲載資料名:
- Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 35
- 発行年:
- 1985
- 開始ページ:
- 575
- 終了ページ:
- 582
- 総ページ数:
- 8
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837005 [0931837006]
- 言語:
- 英語
- 請求記号:
- M23500/35
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Materials Research Society |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
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Electrochemical Society |
10
国際会議録
Silicon-on-insulator mosfets fabricated in zone-melting-recrystallized poly-Si films on SiO2
North Holland | |
Materials Research Society |
Materials Research Society |
Materials Research Society |
SPIE - The International Society of Optical Engineering |