*THE OCCURRENCE OF DEFECTS IN SILICON CARBIDES AS A RESULT OF PROCESSING MODE AND APPLIED STRESS

*THE OCCURRENCE OF DEFECTS IN SILICON CARBIDES AS A RESULT OF PROCESSING MODE AND APPLIED STRESS

著者名:

掲載資料名:

Defect properties and processing of high-technology nonmetallic materials : symposium held November 1983 in Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

24

発行年:

1984

開始ページ:

351

終了ページ:

364

総ページ数:

14

出版情報:

New York: North-Holland

ISSN:

02729172

ISBN:

9780444009043 [0444009043]

言語:

英語

請求記号:

M23500/24

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015508
シリーズID:	PA00000011
会議名:	Materials Research Society meeting ; Symposium on defect properties and processing of high-technology nonmetallic materials
回次:	1983
会議開催地:	Boston, MA, USA
会議開催年:	1983.11.14-1983.11.17

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