Blank Cover Image

Electronic characterization of compound semeconductor surfaces and interfaces

著者名:
Monch, w.  
掲載資料名:
Interfaces and contacts : symposium held November 1982 in Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
18
発行年:
1983
開始ページ:
285
終了ページ:
300
総ページ数:
16
出版情報:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444008206 [0444008209]
言語:
英語
請求記号:
M23500/18
資料種別:
国際会議録

類似資料:

1 国際会議録 DEEP LEVELS AT COMPOUND-SEMICONDUCTOR INTERFACES

Monch W.

Plenum Press
7 国際会議録 *ELECTRONIC STRUCTURE AND PROPERTIES OF OXIDE SURFACES AND INTERFACES

Stoneham, A. M., Tasker, P. W.

Materials Research Society
2 国際会議録 Electronic Properties of Ideal and Interface-Modified Metal-Semiconductor Contacts

Monch, Winfried

MRS - Materials Research Society
8 国際会議録 SURFACE AND INTERFACE MODIFICATION OF COPPER FOR ELECTRONIC APPLICATIONS

Lanford, W. A., Ding, P. J., Hymes, S., Murarka, S. P.

MRS - Materials Research Society
3 国際会議録 Some Aspects of Surface Science Related to MBE

Monch W.

Martinus Nijhoff Publishers
9 国際会議録 Xanes/Elnes: A Powerful Tool for Interface Characterization of Electronic Materials

W. Y. Ching, P. Rulis, Y. Chen

Electrochemical Society
4 国際会議録 THE ADSORPTION OF GALLIUM ON THE CLEAVED SURFACE OF InP, InAs AND InSb

Rodrigues, W. N., Monch, W.

Materials Research Society
10 国際会議録 Electronic Structure of Polyaromatic Nitrogen Compounds (Surface Analytical and Electro-Optical Investigations)

Kessel R., Stocket D., Schultze W. J.

Society of Plastics Engineers, Inc. (SPE)
5 国際会議録 Interaction of Nitrogen With 6H-SiC Surfaces

Elsbergen, V. van, Rohleder, M., Monch, W.

MRS - Materials Research Society
11 国際会議録 Electronic and Chemical Structure of Conjugated Polymer Surfaces and Interfaces: Implications for Polymer-Based Electronic Devices

Logdlund M., Salaneck R. W.

Society of Plastics Engineers, Inc. (SPE)
6 国際会議録 Depositiou of Cs on Graphitized 4H-SiC Surfaces

Elsbergen,V.van, Nienhaus,H., Monch,W.

Trans Tech Publications
12 国際会議録 Characterization of Semiconductor Surfaces and Interfaces by X-Ray Reflectivity Measurements

Plotz,W., Holy,V., Hoogenhof,W.V.D., Ahrer,W., Frank,N., Schiller,C., Lischka,K.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12