Blank Cover Image

CORRELATION OF OXYGEN AND RECOMBINATION CENTERS ON A MICROSCALE IN Aa-GROWN CZOCHRALSKI SILICON CRYSTALS

著者名:
掲載資料名:
Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
14
発行年:
1983
開始ページ:
177
終了ページ:
180
総ページ数:
4
出版情報:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444008121 [0444008128]
言語:
英語
請求記号:
M23500/14
資料種別:
国際会議録

類似資料:

Nauka, K., Walukiewicz, W., Lagowski, J., Gatos, H. C.

Materials Research Society

7 テクニカルペーパー DEFECT INTERACTIONS IN GaAs SINGLE CRYSTALS

Gatos, H. C., Lagowski, J.

National Aeronautics and Space Administration

UEDA,O., NAUKA,K., LAGOWSKI,J., GATOS,H.C.

Trans Tech Publications

Skowronski, M., Lin, D. G., Lagowski, J., Pawlowicz, L..M., Ko, K. Y., Gatos, H. C.

Materials Research Society

Nauka, K., Lagowski, J., Gatos, H. C.

Materials Research Society

L:I, C.-J., Sun, Q., Lagowski, J., Gatos, H. C.

Materials Research Society

Ueda, O., Nauka, K., Lagowski, J., Gatos, H.C.

Materials Research Society

10 国際会議録 Space Charge Layers

Gatos C. H., Lagowski Jacek

Noordhoof International Publishing

Sun, Q., Lagowski, J., Gatos, H. C.

Materials Research Society

Reiche,M., Reichel,J.

Trans Tech Publications

Gatos, H. C., Lagowski, J.

Materials Research Society

Saishoji, T., Nakamura, K., Nakajima, H., Yokoyama, T., Ishikawa, F., Tomioka, J.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12