*THE NATURE OF POIND DEFECTS AND THEIR INFLUENCE ON DIFFUSION PROCESSES IN SILICON AT HIGH TEMPERATURE,
- 著者名:
- Gosele, U.
- 掲載資料名:
- Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 14
- 発行年:
- 1983
- 開始ページ:
- 45
- 終了ページ:
- 60
- 総ページ数:
- 16
- 出版情報:
- New York: North-Holland
- ISSN:
- 02729172
- ISBN:
- 9780444008121 [0444008128]
- 言語:
- 英語
- 請求記号:
- M23500/14
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Materials Research Society |
Kluwer Academic Publishers |
Materials Research Society |
MRS - Materials Research Society |
Electrochemical Society |
Electrochemical Society |
North-Holland |
Trans Tech Publications |
MRS - Materials Research Society |
Trans Tech Publications |