Single Event Upset Sensitivity of a SRAM: An Overview from Testing Procedures to Device Hardening
- 著者名:
- 掲載資料名:
- Proceedings of the ESA Electronic Components Conference, held at the Conference Centre, ESTEC, Noordwijk, the Netherlands, 12-16 November 1990
- シリーズ名:
- ESA SP
- シリーズ巻号:
- 313
- 発行年:
- 1991
- 開始ページ:
- 351
- 終了ページ:
- 356
- 総ページ数:
- 6
- 出版情報:
- Paris: ESA Publications Division
- ISSN:
- 03796566
- ISBN:
- 9789290920946 [9290920947]
- 言語:
- 英語
- 請求記号:
- E11690/911401
- 資料種別:
- 国際会議録
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3
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Comparative Simulations of Single Event Upsets Induced by Protons and Neutrons in Commercial SRAMs.
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