CHEMICAL MECHANICAL POLISHING OF COPPER AND TANTALUM BARRIER: STUDIES ON SLURRY CHEMISTRY FOR OPTIMUM SELECTIVITY
- 著者名:
- 掲載資料名:
- Semiconductor technology (ISTC 2006) : proceedings of the 5th International Conference on Semiconductor Technology
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2006-03
- 発行年:
- 2006
- 開始ページ:
- 560
- 終了ページ:
- 571
- 総ページ数:
- 12
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774376 [1566774373]
- 言語:
- 英語
- 請求記号:
- E23400/200603
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Electrochemical Society |
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4
国際会議録
Effect of Hydrogen Peroxide on Oxidation of Copper in CMP Slurries Containing Glycine and Cu Sulfate
Materials Research Society |
Materials Research Society |
Electrochemical Society |
Materials Research Society |
Electrochemical Society |
Electrochemical Society |